Imaging Technique Reveals Strains and Defects in Vanadium Oxide

Imaging Technique Reveals Strains and Defects in Vanadium Oxide

Non-destructive imaging uses synchrotron light Researchers led by Edwin Fohtung, an associate professor of materials science and engineering at Rensselaer Polytechnic Institute, have developed a new technique for revealing defects in nanostructured vanadium oxide, a widely used transition metal with many potential applications including electrochemical anodes, optical applications, and supercapacitors. In the research – which was published in an article in the Royal Chemical Society journal, CrystEngComm, and also featured on the cover of the edition – the team detailed a lens-less microscopy technique to capture individual defects embedded in vanadium oxide nanoflakes. “These observations could help explain the origin of defects in structure, crystallinity, or composition gradients observed near grain boundaries in other thin-film or flake technologies,” said Fohtung, an expert in novel synchrotron scattering and imaging techniques. “We …
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